Seminario di analisi numerica
ore
16:30
presso plesso Belmeloro, via Andreatta 8, Bologna
Anomaly detection is a primary need for industrial/manufacturing applications and Datalogic business, but many challenges persist. The collection and annotation of data is expensive and most of the time unpractical as the deployed systems are usually not remotely accessible. The image resolution and the frame rate require computing-intensive algorithms that often do not fit the real-time constraint on embedded devices. In this study, we propose a novel solution that, inspired by recent advancements in this field obtained by normalizing-flow and patch-based feature distribution, combines unsupervised learning with efficient processing to deploy an optimized solution to reach a high classification accuracy while working with few training samples.